New Aerotech catalog for motion system capabilities

A new catalog from Aerotech illustrates the capabilities of the company's motion systems, with examples of real-life motion control challenges and successful solutions for a wide range of applications.

Apr 18th, 2012
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Aerotech, Pittsburgh, PA, has a new catalog to illustrate the capabilities of its motion systems, presenting examples of real-life motion control challenges and successful solutions for a wide range of applications.

The 72-page, illustrated catalog discusses applications of its motion control technology, from single- and multi-axis rate tables to motion simulators, software, and other controls. A section of the catalog addresses surface measurement and profiling, emphasizing challenges of sensor integration, process development and data acquisition. Nondestructive test is explored, including X-ray inspection, ultrasonic testing and the associated components necessary for a multi-axis solution. A section on semiconductor inspection and metrology section looks at ellipsometry, scanning white light interferometry, thin-film measurement, wafer inspection, atomic force microscope positioning, defect detection and particle scanning, reticle inspection, and more. There is also an in-depth examination of the various integrated automation and data acquisition systems and components, and how they come together to create a seamless, highly accurate and cost-effective motion system.

The new catalog Motion and Automation for Test, Measurement and Inspection is downloadable as a PDF document, or can be ordered as a printed hard copy.

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